Werth Contour Probe has a New Look

- The contour tracer for profile and roughness measurement -

The new Werth Contour Probe WCP has been completely redesigned, and is now integrated in the Werth magnetic interface mounting system. A new guide system now allows scanning with uniform accuracy in all axes, using probe radii as small as 2 µm. The sensor works in combination with the Werth Laser Probe, which continuously detects the deflection of the probe tip in Z, and transmits the corresponding measured values to WinWerth. The WCP can be interchanged easily with a park station. 
Tasks that previously required contour tracer machines (also known as contour graphs) can be completed with the Werth Contour Probe (patent) in multisensor coordinate measuring machines. The tactile optical contour sensor allows, for the first time, tactile contour measurement in defined workpiece coordinates. This sensor expands the Werth multisensor concept – the job of the classical section probe is taken over by the multisensor coordinate measuring machine. The Werth Contour Probe can also be used for calibrating laser contour measurements. An extensive range of various probe tips is available.