| 1951 |
Founding of Werth Messtechnik GmbH in Düsseldorf |
| 1955 |
First profile projector Record ® E |
| 1958 |
Company relocated to Gießen |
| 1968 |
First digital micrometer |
| 1973 |
First digital caliper |
| 1977 |
Werth Tastauge - optical edge sensor |
| 1980 |
Optimus® CC |
| 1988 |
Inspector® multisensor coordinate measuring machine with laser sensor and electronic, telecentric 2-step zoom |
| 1990 |
BestFit - software for fully automatic contour comparison |
| 1992 |
VideoCheck® |
| 1993 |
Integration of touch probes |
| 1994 |
Wobble compensation for rotary axes |
| 1995 |
Dynamic probe for 3D-scanning |
| 1996 |
Inspector® FQ - fastest CMM worldwide |
| 1998 |
Werth Fiber Probe WFP - smallest and most accurate probe worldwide (Patent) |
| 1999 |
Inspector® V - fastest multisensor CMM worldwide for highly accurate tool measurement (Patent application) |
| 1999 |
Werth Zoom - world first - magnification and working distance are adjusted automatically (Patent) |
| 2000 |
ToleranceFit® - Software for fully automatic gauging (Patent application) |
| 2001 |
WinWerth® AutoFeature – The benchmark in easy operation (Patent pending) |
| 2001 |
Werth MultiRing - optimum contrast in incident light (Patent application) |
| 2002 |
Werth FlatScope - the modern ”profile projector” (Patent pending) |
| 2002 |
Werth ScopeCheck® V - extension of basic line for measurement of turned parts and tools |
| 2003 |
Color image analysis for multisensor CMM‘s |
| 2003 |
Werth ShaftScope for turned parts |
| 2003 |
Werth Inspectorr® FQ – 2nd generation of FQ drive technology |
| 2003 |
Werth ScopeCheck® 300/400 - heavy duty granite base for increased stability and improved accuracy (patent pending) |
| 2004 |
VideoCheck® EA– patent Z axis ram design allows easy integration of additional sensors for increased productivity |
| 2004 |
VideoCheck® V HA– the most accurate multisensor CMM worldwide for tool measurement |
| 2004 |
Werth Sensor IP 40T – compact sensor head for flexible measurement with image processing sensor on articulating probe heads (patent pending) |
| 2004 |
Werth Contour Probe WCP – the contour tracer for profiles and roughness (patent) |
| 2005 |
Werth Laser Line Probe LLP – extremely fast optical determination of measuring points on 3D workpieces |
| 2005 |
Werth TomoScope® – world first: Computer Tomography in multisensor metrology |
| 2005 |
Werth ScopeCheck® V 200 – economical measurement of tools and shafts in the shopfloor environment |
| 2005 |
Werth ScanCheck 400 – ultra-compact CNC scanning measuring machine for economical and accurate quality control in the shopfloor environment |
| 2006 |
Werth VideoCheck® UA – Multisensor CMM with nanometer resolution (Ultra Accuracy) for high precision parts and 3D micro geometries |
