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Dr.-Ing. Siegfried Werth Stiftung

Funding of scientific work in the field of non-contact dimensional metrology

After the death of Dr.-Ing. Siegfried Werth, his widow, Mrs. C. H. Maria Werth, established the Dr.-Ing. Siegfried Werth Foundation in 1987, which was converted into a legally capable, non-profit foundation in 1995.

 
Introduction

Foundation in memory of the pioneering developments and life's work of Dr.-Ing. Siegfried Werth

In 1951, Dr.-Ing. Siegfried Werth founded an apparatus and mechanical engineering company in Düsseldorf that manufactured measuring machines and measuring profile projectors. In 1958 the company moved to Giessen, where a new production facility was built. This formed the basis for today's Werth Messtechnik GmbH, which in this tradition is an international leader in the field of coordinate metrology with optics, probe, computed tomography and multi-sensor systems.

The purpose of the Dr.-Ing. Siegfried Werth Stiftung is to promote and finance scientific work in the field of non-contact dimensional metrology. The foundation's purpose is fulfilled in particular by awarding prizes for scientific work by young scientists according to their first academic degree in the field of industrial metrology or related fields or by awarding research contracts including doctoral projects to talented young scientists.

The sole organ of the Foundation is the Board of Trustees. It consists of four honorary trustees, from among whom the Chairman of the Board of Trustees is elected for a term of 5 years and who represents the Foundation together with another member in all judicial and extrajudicial matters. The registered office and address of the Foundation is Siemensstr. 19 in 35394 Giessen.

Introduction - Foundation in memory of the pioneering developments and life's work of Dr.-Ing. Siegfried Werth
 
Curriculum vitae

Metrology Developer and Entrepreneur

Dr.-EngIng. Siegfried Werth founded an apparatus and mechanical engineering company, which later became Werth Messtechnik GmbH, and enabled the automation of optical measurements with the Development of the first optical sensor for measuring projectors.

Curriculum vitae - Metrology Developer and Entrepreneur
1907

Born in Berlin

1926

High school graduation in Berlin

1931

Mechanical Engineering Studies at the Technical University of Berlin

1931-1936

Assistant activity at the Technical University of Berlin, at the Institute for Machine Tools and Factory Operation

1937

Doctorate at the Technical University of Berlin

1936-1937

Plant engineer at BMW in Eisenach

1937-1939

Operating assistant at the Augsburg-Nuremberg machine factory (MAN) in Nuremberg

1939-1941

Plant manager at the MAN plant in Augsburg and the engine plant in Hamburg

1941

Manual written for machine workers

1948

Self-employed engineer in Düsseldorf

1951

Foundation of Werth Apparate- und Maschinenbaufirma in Düsseldorf, Design and Production of Measuring Machines for the Wire Industry

1951

Drawing die measuring system Werth Panohol

1953

Profile projector development

1955

Werth Record – ergonomic profile projector with integrated beam path

1958

New company location in Giessen

1977

Werth Tastauge – first fibre-optic sensor for measurement and profile projectors

1979

Change of name to Dr.-Ing. Siegfried Werth GmbH

1980

Werth Optimus CC – first CNC-controlled measuring projector

1982

Deceased in Giessen

 
News

Dr.-Ing. Siegfried Werth Prize awarded

In February, during a ceremony at the premises of Werth Messtechnik GmbH in Giessen, the Dr.-Ing. Siegfried Werth Foundation awarded a prize to a scientific work in the field of non-contact dimensional metrology. The awardee is Mr. Patrick Steidl for an excellent Bachelor's thesis at the THM University of applied sciences, which deals with the Development of new sensor technologies for X-ray computed tomography. Since the Werth Technology Days, during which the award ceremony normally takes place, had to be cancelled in spring 2021 due to legal regulations, the award ceremony took place on a small scale.

News - Dr.-Ing. Siegfried Werth Prize awarded
 
Awardees and sponsored projects

Outstanding scientific work in the field of non-contact dimensional metrology

In accordance with the purpose of the foundation, the following young scientists were awarded prizes by the Dr.-Ing. Siegfried Werth Foundation or scientific work was supported by scholarships:

Awardees and sponsored projects - Outstanding scientific work in the field of non-contact dimensional metrology
1988

Dipl.-Ing. Wolfgang Rauh, Fraunhofer IPA, Stuttgart

Dr.-Ing. Siegfried Werth Prize
"Integration of image processing in profile projectors"

1990

Dr.-Ing. habil. Reimar Lenz, TU Munich

Dr.-Ing. Siegfried Werth Prize
"Development of a high-resolution CCD camera with programmable resolution"

1991

Dr.-Ing. Thomas Sefker, University GHS Essen

Dr.-Ing. Siegfried Werth Prize
"Generalised representation of the behaviour of isothermal free jets"

1994

Dr.-Ing. Christian Troll/Dipl.-Ing. Uwe Kipping, TU Chemnitz-Zwickau

Dr.-Ing. Siegfried Werth Prize
"Transformation measuring systems with evaluation of barcode structures for absolute displacement and angle measurement"

1996

Dr.-Ing. Edgar Reiner Fischer, TU Stuttgart

Dr.-Ing. Siegfried Werth Prize
"Double heteroyn interferometry for profile and distance measurement on optically rough surfaces"

1998

Dr.-Ing. Dipl.-Phys. Ralph Peter Knorpp, Fraunhofer Institute Stuttgart

Dr.-Ing. Siegfried Werth Prize
"Shape guidelines for reverse engineering extraction of edges and radius runout lines from unstructured 3D measurement point sets"

2000

Dr.-Ing. Horst Konstantin Mischo, Fraunhofer Institute Aachen

Dr.-Ing. Siegfried Werth Prize
"The Virtual Interferometer – Model-based Optimisation"

2000

Professor Dr.-Ing Thomas Luhmann, University of Applied Sciences Odenburg

Special Prize
"Close Range Photogrammetry"

2001

Dipl.-Ing. Simon Winkelbach, Technische Universität Braunschweig

Dipl.-Ing. Marcus Jacob, University of Applied Sciences Jena

Oliver Gächter/Roger Caviezel, Technikum Buchs, Switzerland

Special awards for the 50th anniversary of Werth Messtechnik GmbH

2003

Dr Bodo Rosenhahn, Christian-Albrechts-Universität zu Kiel

Dr.-Ing. Siegfried Werth Prize
"Pose Estimation Revisited"

2005

Dr.-Ing. Marcus Petz, Technical University of Braunschweig

Dr.Ing. Siegfried Werth Prize "Scanning reflection photogrammetry for the measurement of reflective surfaces"

2006

Dr.-Ing. Jens Pannekamp, Fraunhofer IPA, Stuttgart

Dr.-Ing. Siegfried Werth Prize
"Adaptive methods for the evaluation of textured surfaces"

2008

Dipl.-Ing. Andreas Gläser, West Saxon University of Applied Sciences Zwickau

- PhD scholarship -

2010

Dipl.-Phys.Daniel Weigel, Friedrich Schiller University Jena

Award of the Dr.-Ing. Siegfried Werth Foundation for outstanding master's or diploma theses
"Resolution enhancement in optical scanning microscopes using an image-inverting interferometer"

2011

Dr. Marco Hornung, Friedrich Schiller University Jena

Award of the Dr.-Ing. Siegfried Werth Foundation for outstanding dissertations
"Mosaic grating compressor for femtosecond laser pulses of high energy"

2012

Florian Flad, Friedrich-Alexander University Erlangen-Nuremberg

Award for outstanding student research
"Validation of a measurement uncertainty simulation for X-ray computed tomography"

2012

Jan-Hinrich Eggers, Technical University of Braunschweig

Award for outstanding diploma thesis
"Development of the illumination optics of a microstrip projection unit"

2012

Ekaterina Pshenay-Severin, Friedrich Schiller University Jena

Excellent Dissertation Award
"Design, Realisation and Characterisation of Optical Metamaterials with Negative Refractive Index"

2012

Martin Peterek, Rhenish-Westphalian Technical University Aachen

Award for outstanding diploma thesis
"Mosaic grating compressor for femtosecond laser pulses of high energy"

2012

Dr.-Ing. Philipp Krämer, Friedrich-Alexander University Erlangen-Nuremberg

Award for outstanding dissertation
"Simulation-based estimation of the accuracy of measurements with X-ray computed tomography"

2013

Ms Johanna Witte

Award for particularly good student research
"Concept for the measurement of deep blind hole diameters"

2013

Carl Alexander Schuler, Friedrich-Alexander University Erlangen-Nuremberg

Award for outstanding dissertations
"Extension of the application limits of sensors for micro- and nano-measurement technology by dynamic sensor tracking using nanometre-resolved electrical near-field interaction"

2013

Jens Thomas, Friedrich Schiller University Jena

Excellent Dissertation Award
"Mode control with ultra-short pulse written fibre Bragg gratings"

2014

Nicolai-Andre Brill, Fraunhofer IPT, Aachen

Award for Outstanding Master Thesis
"Development of a polarisation-sensitive optical coherence tomography (OCT) system for real-time measurement of semitransparent materials"

2014

Marcus Große, Friedrich Schiller University Jena

Excellent Dissertation Award
"Investigations on correlation-based point assignment in stereophotogrammetric 3D object measurement using sequences of structured illumination"

2014

Julia Kroll, Fraunhofer Institute for Manufacturing Engineering and Automation IPA, Stuttgart

Excellent Dissertation Award
"Task-adapted controlled surface extraction from 3D computed tomography data"

2014

Sebastian Pollmanns, Chair of Industrial Metrology and Quality Management Machine Tool Laboratory WZL of RWTH Aachen University

Excellent Dissertation Award
"Determination of uncertainty contributions in medical computed tomography measurements for image-based navigated surgery"

2015

Michael Zürch, Friedrich Schiller University Jena

Award for outstanding dissertations
"High-Resolution Extreme Ultraviolet Microscopy"

2015

Mario Salzinger, Deggendorf University of Applied Sciences

Award for particularly good bachelor theses
"Investigation of filter properties during measurement with industrial computed tomography in comparison with tactile measurement systems"

2015

Lizhuo Chen, Friedrich-Alexander University Erlangen-Nuremberg

Excellent Dissertation Award
"Light Refractive Tomography for Noninvasive Ultrasound Measurements in Various Media

2015

Wito Hartmann, Friedrich-Alexander University Erlangen-Nuremberg

Award for outstanding dissertations
"Measurement and evaluation strategies for model-based assessment of functional properties of microstructured surfaces"

2016

Ruedi Jung, Friedrich-Alexander University Erlangen-Nuremberg

Award for outstanding master's thesis
"Investigations on the effect of different influencing parameters on dimensional computed tomography measurements"

2016

Angela Klein, Friedrich Schiller University Jena

Dissertation Excellence Award
"Scanning Near-Field Optical Microscopy: From Single-Tip to Dual-Tip Operation"

2017

Anton Sigl, Deggendorf University of Technology

Award for particularly good bachelor theses
"Design and construction of a modular CT system for micro and sub-µ applications"

2017

Marc Fischer, Technical University of Braunschweig

Excellent Dissertation Award
"Deflectometry in Transmission – A new measurement technique for capturing the geometry of aspherical refractive optics"

2017

Arno Klenke, Friedrich Schiller University Jena

Award for outstanding dissertations
"Performance Scaling of laser amplifiers via coherent combination of ultrashort pulses"

2018

Stefan Heist, Friedrich Schiller University Jena

Excellent Dissertation Award
"High-speed 3D shape measurement using aperiodic sinusoidal patterns"

2018

Robert Kuschmierz, Dresden University of Technology

Award for outstanding dissertations
"Interferometric laser sensors for three-dimensional, in-situ shape measurement of rotating bodies"

2019

Sina Saravi, Friedrich Schiller University Jena

Excellent Dissertation Award
"Photon-pair generation in photonic crystal waveguides

2019

Joscha Maier, German Cancer Research Center Heidelberg

Distinguished Dissertation Award
"Artifact Correction and Real-Time Scatter Estimation for X-Ray Computed Tomography in Industrial Metrology"

2019

Klaus Bergner, Fraunhofer Institute for Applied Optics and Precision Engineering IOF Jena

Excellent Dissertation Award
"Time- and spatially-resolved analysis of the interaction of intense ultrashort laser pulses with glasses"

2019

Henrik Sprankel, THM University of applied sciences

Award for particularly good bachelor theses
"Investigation of influencing parameters on the length measurement error in coordinate measurement with X-ray computed tomography"

2020

Silvan Othmar Ammann and Gilson Orlando, Interstate University of Applied Sciences Buchs (NTB)

Award for particularly good bachelor theses
"Pattern Illumination for Lightfield Camera"

2020

Maximilian Heck, Fraunhofer Institute for Applied Optics and Precision Engineering IOF Jena

Dissertation Excellence Award
"Tailored light propagation by femtosecond pulse written long period fibre gratings"

2020

Martin Heusinger, Friedrich Schiller University Jena (Faculty of Physics and Astronomy)

Award for Outstanding Dissertations
"Investigations on deterministic and stochastic scattered light in highly efficient binary diffraction gratings"

2020

Julian Wittmann, Deggendorf University of Applied Sciences

Award for outstanding master's thesis
"Determination of a 3D model of the inner volume of shoes with the help of computed tomography data"

2021

Patrick Steidl, THM University of applied sciences

Award for particularly good bachelor theses
"Contributions to the Development of an X-ray detector for coordinate measuring machines with X-ray computed tomography"

2021

Thomas Siefke, Friedrich Schiller University Jena

Award for outstanding dissertations
"Development of wire grating polarizers for applications in the ultraviolet to the vacuum ultraviolet spectral range"

2021

Roy Seitz, OST University of Applied Sciences of Eastern Switzerland

Excellent Master Thesis Award
"StereoVision: High-Speed Stream-Based Parallel Dense Disparity Map Calculation"

2022

Hannes Radner, Dresden University of Technology

Excellent Dissertation Award
"Adaptive Optical Wavefront Correction Using the Fresnel Guide Star and a Hybrid Control Loop Implemented on a Field-Programmable System-on-Chip"

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