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Optical

Contactless and fast signal transmission by light

The benefits of optical metrology lie in non-contact measurement. This makes it possible to measure sensitive workpieces as well as those with small features. Non-contact measurement eliminates the need for time-consuming set-up, which is difficult with small or elastic workpieces.

Werth Image Processing BV
Werth Image Processing BV
Autofocus sensor
Autofocus sensor
Werth Laser Probe WLP
Werth Laser Probe WLP
Chromatic Focus Point Sensor CFP
Chromatic Focus Point Sensor CFP
Chromatic Focus Zoom CFZ
Chromatic Focus Zoom CFZ
Chromatic Focus Line sensor CFL
Chromatic Focus Line sensor CFL
Werth 3D Patch
Werth 3D Patch
Nano Focus Probe NFP
Nano Focus Probe NFP
Werth Interferometer Probe WIP
Werth Interferometer Probe WIP
Laser Line Probe LLP
Laser Line Probe LLP
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